The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jan. 13, 2009
Applicants:

Andrew P. Duchon, Somerville, MA (US);

Robert Mccormack, Somerville, MA (US);

William J. Salter, Harvard, MA (US);

Paul David Allopenna, Storrs, CT (US);

Shawn Weil, Melrose, MA (US);

John Colonna-romano, Stow, MA (US);

David Kramer, Waltham, MA (US);

Inventors:

Andrew P. Duchon, Somerville, MA (US);

Robert McCormack, Somerville, MA (US);

William J. Salter, Harvard, MA (US);

Paul David Allopenna, Storrs, CT (US);

Shawn Weil, Melrose, MA (US);

John Colonna-Romano, Stow, MA (US);

David Kramer, Waltham, MA (US);

Assignee:

Aptima, Inc., Woburn, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06N 7/00 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06Q 10/10 (2013.01);
Abstract

The present invention relate to a method and system to predict the likelihood of data topics that may occur from data sources. The likelihood of the data topics may be predicted over other dimensions of time or over other dimensions. In the present invention, a topic means a defining characteristic, usually represented as a data element, of a single feature, activity, subject, behavior, event or an aggregation of such defining characteristics.


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