The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Sep. 12, 2011
Applicants:

Steven J Simske, Fort Collins, CO (US);

Malgorzata M Sturgill, Fort Collins, CO (US);

Marie Vans, Ft. Collins, CO (US);

George D Guillory, The Woodlands, TX (US);

Paul S Everest, Albany, OR (US);

Inventors:

Steven J Simske, Fort Collins, CO (US);

Malgorzata M Sturgill, Fort Collins, CO (US);

Marie Vans, Ft. Collins, CO (US);

George D Guillory, The Woodlands, TX (US);

Paul S Everest, Albany, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/03 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); G06K 9/036 (2013.01); G06K 9/6202 (2013.01); G06K 9/6218 (2013.01);
Abstract

An image analyzer () aggregates image samples () into a cluster () based on the image samples () being classified from a subset of image metrics applied to a reference sample (). The image analyzer () generates an image quality output () by analyzing a distance () from the cluster () relative to another cluster.


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