The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Aug. 22, 2011
Mohammad Mehedy Masud, Dallas, TX (US);
Latifur Rahman Khan, Plano, TX (US);
Bhavani Marienne Thuraisingham, Dallas, TX (US);
Qing Chen, Plano, TX (US);
Jing Gao, Urbana, IL (US);
Jiawei Han, Urbana, IL (US);
Mohammad Mehedy Masud, Dallas, TX (US);
Latifur Rahman Khan, Plano, TX (US);
Bhavani Marienne Thuraisingham, Dallas, TX (US);
Qing Chen, Plano, TX (US);
Jing Gao, Urbana, IL (US);
Jiawei Han, Urbana, IL (US);
BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS, Urbana, IL (US);
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM, Austin, TX (US);
Abstract
Systems and methods for data classification and novel data class detection are provided. In one illustrative embodiment, a system or method for detecting a novel class includes receiving a data stream comprising a plurality of data points, and identifying a set of filtered outliers, in the plurality of data points, that are outside of a decision boundary. A cohesion and a separation for the set of filtered outliers may be determined. A novel class may be detected using the cohesion and the separation of the set of filtered outliers, and the novel class may include the set of filtered outliers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile