The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Mar. 04, 2012
Kenneth L. Mcclamroch, Chapel Hill, NC (US);
Jennifer G. Becker, New Hill, NC (US);
Vindokumar Raghavan, Woburn, MA (US);
Peter Sun, Cambridge, MA (US);
Kenneth L. McClamroch, Chapel Hill, NC (US);
Jennifer G. Becker, New Hill, NC (US);
VindoKumar Raghavan, Woburn, MA (US);
Peter Sun, Cambridge, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present invention provide a method, system and computer program product for automated discovery and analysis of test management domain assets. A method for automated discovery of test management domain assets includes crawling different, remotely disposed repositories of test management artifacts and locating test management artifacts in the different, remotely disposed repositories of test management artifacts. The method also includes selecting for each located test management artifact an analyzer configured to process test management artifacts of a type consistent with a type of the located test management artifact. Finally, the unified repository can be queried to produce a result based upon test management artifact data stored in the unified repository, though the test management artifact data had been located in the different, remotely disposed repositories of test management artifacts.