The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jul. 21, 2010
Applicant:

Ryo Sasaki, Utsunomiya, JP;

Inventor:

Ryo Sasaki, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 9/00 (2006.01); G01B 11/24 (2006.01); G03B 27/32 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G03F 9/7049 (2013.01); G01B 9/0209 (2013.01); G01B 9/02019 (2013.01); G01B 9/02022 (2013.01); G01B 9/02028 (2013.01); G01B 11/2441 (2013.01); G03B 27/32 (2013.01); G03F 9/7034 (2013.01); G01B 2290/45 (2013.01); G01B 2290/60 (2013.01);
Abstract

The present invention provides a measurement apparatus which measures a height of a test surface, the apparatus including an image sensing device including a plurality of detection units configured to detect interfering light formed by measurement light from the test surface and reference light from a reference surface, and an optical system configured to guide measurement light beams, reflected at a plurality of measurement points on the test surface, and reference light beams, reflected at a plurality of reference points on the reference surface, to the plurality of detection units, respectively, wherein the reference surface generates differences among optical path differences between the measurement light beams and the reference light beams which enter the plurality of detection units, respectively.


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