The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jun. 18, 2013
Applicant:

Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;

Inventors:

Hironori Yaginuma, Ibaraki, JP;

Takashi Shimizu, Ibaraki, JP;

Kazuki Uwada, Ibaraki, JP;

Nao Murakami, Ibaraki, JP;

Tadashi Kojima, Ibaraki, JP;

Kentarou Takeda, Ibaraki, JP;

Assignee:

NITTO DENKO CORPORATION, Ibaraki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); H01L 51/52 (2006.01); C08G 64/06 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3083 (2013.01); C08G 64/06 (2013.01); G02B 5/3016 (2013.01); H01L 51/5293 (2013.01);
Abstract

Provided is a polarizing plate that has an excellent viewing angle characteristic and suppresses changes in display characteristics. A polarizing plate of the present invention is used in an organic EL panel, and includes a polarizer (), a first retardation layer (), and a second retardation layer (). The first retardation layer () shows a refractive index characteristic of nx>ny≧nz, satisfies a relationship of Re(450)<Re(550), and has a water absorption rate of 3% or less. The second retardation layer () shows a refractive index characteristic of nz>nx≧ny. A laminate of the first retardation layer () and the second retardation layer () has an Re(550) of from 120 nm to 160 nm and an Rth(550) of from 40 nm to 100 nm.


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