The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Oct. 30, 2011
Harutada Dewa, Tokyo, JP;
Kiyoyasu Hiwada, Tokyo, JP;
Akira Nakazawa, Kobe, JP;
Nobuaki Terakado, Kobe, JP;
Harutada Dewa, Tokyo, JP;
Kiyoyasu Hiwada, Tokyo, JP;
Akira Nakazawa, Kobe, JP;
Nobuaki Terakado, Kobe, JP;
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Guala Technology Co., Ltd., Kobe-shi, JP;
Abstract
This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.