The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Jul. 12, 2011
Alan R Greenberg, Boulder, CO (US);
Jack Gilron, Beer Sheva, IL;
Keith D Cobry, Lafayette, CO (US);
Elmira Kujundzic, Erie, CO (US);
Xiao Yun LU, Longmont, CO (US);
Guy Mizrahi, Beer Sheva, IL;
Michael Peterson, Orono, ME (US);
Alan R Greenberg, Boulder, CO (US);
Jack Gilron, Beer Sheva, IL;
Keith D Cobry, Lafayette, CO (US);
Elmira Kujundzic, Erie, CO (US);
Xiao Yun Lu, Longmont, CO (US);
Guy Mizrahi, Beer Sheva, IL;
Michael Peterson, Orono, ME (US);
THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE, Denver, CO (US);
BEN-GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY, Beer-Sheva, IL;
Abstract
A method of early detection of scaling on internal surfaces of conduits of water processing equipment, is provided herein. The method includes: transmitting ultrasonic signals through the wall of the conduits; deriving data samples from received ultrasonic signals or reflections thereof; calculating a moving average of the scatter of the ultrasonic signals, over time, based on the data samples; applying a statistical operand to the moving average, to yield a statistical distribution metric; determining a dynamic window defined by: (i) an upper boundary being the moving average plus at least a fraction of the statistical distribution metric and (ii) a lower boundary being the moving average minus the at least a fraction of the statistical distribution metric; generating a trend line being a smooth fitting of the derived samples; and monitoring the trend line within the window to detect a crossover of the trend line at either of the boundaries.