The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jul. 19, 2012
Applicants:

Peter Munro, Como, AU;

Alessandro Olivo, London, GB;

Konstantin Ignatyev, Didcot, GB;

Robert Speller, Bedfordshire, GB;

Inventors:

Peter Munro, Como, AU;

Alessandro Olivo, London, GB;

Konstantin Ignatyev, Didcot, GB;

Robert Speller, Bedfordshire, GB;

Assignee:

UCL BUSINESS PLC, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/046 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); A61B 6/5205 (2013.01); G01N 2223/419 (2013.01);
Abstract

A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.


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