The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jan. 26, 2007
Applicants:

Michael Bassler, Menlo Park, CA (US);

Peter Kiesel, Palo Alto, CA (US);

Oliver Schmidt, Palo Alto, CA (US);

Inventors:

Michael Bassler, Menlo Park, CA (US);

Peter Kiesel, Palo Alto, CA (US);

Oliver Schmidt, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 21/64 (2006.01); G06F 19/00 (2011.01); G06F 19/12 (2011.01); G01N 31/00 (2006.01); G06G 7/58 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6408 (2013.01); G01N 21/6458 (2013.01); G06F 19/12 (2013.01); G06F 19/345 (2013.01); G01N 2015/1075 (2013.01); G01N 2015/1486 (2013.01); G06F 2217/16 (2013.01);
Abstract

A method is provided for extracting the position of a particle, e.g., a moving or stationary particle that is excited or is emitting light. The method includes, among other steps, detecting and recording a signal based on, for example, the movement of the particle, a correlation step to eliminate noise and to create a transformed signal, a matching or fitting step to match the transformed signal to a fit function and an extracting or determining step to determine the position of the particle from the fit function. In one form, at least two particle positions are detected so that the distance between the subject particles can be determined.


Find Patent Forward Citations

Loading…