The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Aug. 06, 2012
Applicants:
Yuichi Furukawa, Toyota, JP;
Shingo Nakamura, Toyota, JP;
Yuji Okada, Toyota, JP;
Fumio Kawahara, Toyota, JP;
Inventors:
Yuichi Furukawa, Toyota, JP;
Shingo Nakamura, Toyota, JP;
Yuji Okada, Toyota, JP;
Fumio Kawahara, Toyota, JP;
Assignees:
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-Shi, JP;
MEIWA E-TEC CO., LTD., Toyota-Shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/12 (2006.01); G01J 5/08 (2006.01); G01J 5/02 (2006.01); G01J 5/04 (2006.01); G01J 5/52 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0003 (2013.01); G01J 5/0044 (2013.01); G01J 5/02 (2013.01); G01J 5/026 (2013.01); G01J 5/04 (2013.01); G01J 5/043 (2013.01); G01J 5/08 (2013.01); G01J 5/0803 (2013.01); G01J 5/0846 (2013.01); G01J 5/0859 (2013.01); G01J 5/12 (2013.01); G01J 5/522 (2013.01); G01J 2005/0077 (2013.01); G01J 2005/0081 (2013.01);
Abstract
A technique for an infrared radiation thermometer used for thermography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.