The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

May. 07, 2013
Applicant:

Physical Optics Corporation, Torrance, CA (US);

Inventors:

Christopher Thad Ulmer, San Pedro, CA (US);

Paul Shnitser, Irvine, CA (US);

David Harold Miller, San Pedro, CA (US);

Edward Matthew Patton, Torrance, CA (US);

Paul Wilkinson, San Pedro, CA (US);

Assignee:

Physical Optics Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01);
Abstract

Profilometers for industrial metrology and other applications are described. A line is projected on a surface to be profiled. The line is scanned to build a three dimensional point cloud allowing the three-dimensional (3D) profile of the surface to be determined. In some embodiments, the line is projected by a laser system. In other embodiments, the line is projected by a digital micromirror device (DMD). In still further embodiments, multiple lines, or other patterns are projected.


Find Patent Forward Citations

Loading…