The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Feb. 07, 2011
Michael Gabi, Zürich, CH;
Janos Voeroes, Zürich, CH;
Stefan Pablo Doerig, Zürich, CH;
Pascal Behr, Zürich, CH;
Philipp Stiefel, Zürich, CH;
Thomaso Zambelli, Zürich, CH;
Julia Vorholt-zambelli, Zürich, CH;
Michael Gabi, Zürich, CH;
Janos Voeroes, Zürich, CH;
Stefan Pablo Doerig, Zürich, CH;
Pascal Behr, Zürich, CH;
Philipp Stiefel, Zürich, CH;
Thomaso Zambelli, Zürich, CH;
Julia Vorholt-Zambelli, Zürich, CH;
ETH Zürich, Zürich, CH;
Abstract
The invention relates to a method for spatially manipulating a microscopic object including providing a cantilever () having a tip with an opening () and a microchannel () extending through the cantilever () in its longitudinal direction. A suspension means is provided for holding the cantilever () and spatially moving the cantilever along a predetermined spatial path. A pressurizing means is provided for applying a predetermined pressure to the microchannel () and the cantilever () is moved with its tip to the microscopic object to be spatially manipulated. At least a part of the microscopic object is picked up with said cantilever () by reducing the pressure within the microchannel () relative to the pressure outside the tip of the cantilever (). The microscopic object is then moved along a predetermined spatial path by means of the cantilever ().