The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Nov. 27, 2013
Applicants:

Mamoru Yorimoto, Kanagawa, JP;

Tatsuhiko Okada, Kanagawa, JP;

Daisaku Horikawa, Kanagawa, JP;

Makoto Moriwaki, Kanagawa, JP;

Inventors:

Mamoru Yorimoto, Kanagawa, JP;

Tatsuhiko Okada, Kanagawa, JP;

Daisaku Horikawa, Kanagawa, JP;

Makoto Moriwaki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/125 (2006.01); B41J 29/38 (2006.01); B41J 11/00 (2006.01);
U.S. Cl.
CPC ...
B41J 2/125 (2013.01); B41J 11/0095 (2013.01); B41J 29/38 (2013.01);
Abstract

An image forming apparatus which reads a test pattern formed by ejecting liquid droplets onto a recording medium to adjust an ejection timing of the liquid droplets is disclosed. The image forming apparatus includes a reading unit including a light emitting unit and a light receiving unit; a sensitivity adjusting unit; a relative movement unit; a first correction unit which detects a position of the test pattern; a second correction unit which detects the position of the test pattern; and a correction method selecting unit which selects the first correction unit or the second correction unit based on adjusting results of sensitivity adjusted by the sensitivity adjusting unit.


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