The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Dec. 17, 2011
Tobias Schmitt-manderbach, Jena, DE;
Daniel Bublitz, Rausdorf, DE;
Roland Bergner, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention relates to a solution for interferometrically measuring the eye length and the anterior eye segment after the optical axis of the measuring system has been aligned with the optical axis of an eye. The device according to the invention for interferometrically measuring the eye length and the anterior eye segment consists of an illumination source, at least one interferometric measuring array with external reference, diverse optical imaging systems, and a control and evaluation unit. The illumination source has high spatial coherence and low coherence of time. Preferably, light is emitted by the illumination device from the NIR range, having a wavelength of 700-1000 nm, for example. Furthermore, an optical imaging system is arranged in front of the eye such that the illumination light impinges on the eye as a nearly collimated beam.