The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Jul. 26, 2011
Applicants:
Manfred Prantl, Graz, AT;
Stefan Scherer, Graz, AT;
Martin Lenz, Graz, AT;
Matthias Ruther, Graz, AT;
Horst Bischof, Eggersdorf B. Graz, AT;
Inventors:
Manfred Prantl, Graz, AT;
Stefan Scherer, Graz, AT;
Martin Lenz, Graz, AT;
Matthias Ruther, Graz, AT;
Horst Bischof, Eggersdorf B. Graz, AT;
Assignees:
Alicona Imaging GmbH, Raaba, AT;
Technische Universität Graz, Graz, AT;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); H04N 13/02 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0207 (2013.01); G01B 11/2513 (2013.01); G06T 7/0069 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01);
Abstract
Method for compensating illumination deficiencies in microscopic 'shape from focus (SFF)', wherein firstly the reflectance of the scene is estimated by way of a projector-camera system and then microscopic 'shape from focus (SFF)' is applied to a stack of reflectance maps rather than to the original image data.