The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jun. 17, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hideyasu Hongu, Tokyo, JP;

Makoto Yokozeki, Tokyo, JP;

Kazunori Ishii, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); H04N 5/232 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23219 (2013.01); G06K 9/00228 (2013.01);
Abstract

A subject detection device includes: a first detection unit that detects a region of a first detection target from an image; a second detection unit that detects from the image a region of a second detection target from which the region of the first detection target can be estimated; and a control unit that controls to display in a predetermined mode indicating the region of the first detection target if a predetermined condition is satisfied, wherein when the first detection unit detects the region of the first detection target and the second detection unit detects the region of the second detection target when the control unit controls to not display in the predetermined mode, the control unit reduces the predetermined condition as compared with when the region of the second detection target is not detected.


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