The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Oct. 11, 2013
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Edmund O. Schweitzer, III, Pullman, WA (US);

Mangapathirao Venkata Mynam, Pullman, WA (US);

Daqing Hou, Des Moines, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H02H 3/08 (2006.01); H02H 3/52 (2006.01); H02H 7/26 (2006.01);
U.S. Cl.
CPC ...
H02H 3/08 (2013.01); H02H 3/52 (2013.01); H02H 7/261 (2013.01);
Abstract

Systems and methods are presented for detecting high-impedance faults (HIFs) in an electric power delivery system using a plurality of coordinated high-impedance fault detection systems. In certain embodiments, a method for HIFs may include receiving first and second current representations associated with first and second locations of the electric power delivery system respectively. Based on at least one of the first and second current representations, the occurrence of an HIF may be determined. A relative location of the HIF may be determined based on a relative amount of interharmonic content associated with an HIF included in the first and second current representations, and a protective action may be taken based on the determined relative location.


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