The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jun. 06, 2014
Applicant:

Everdisplay Optronics (Shanghai) Limited, Shanghai, CN;

Inventors:

Chia-che Hsu, Shanghai, CN;

Chia-chi Huang, Shanghai, CN;

Wei-ting Chen, Shanghai, CN;

Min-ching Hsu, Shanghai, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 27/32 (2006.01); H01L 29/66 (2006.01); H01L 29/786 (2006.01); H01L 27/12 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3244 (2013.01); H01L 27/127 (2013.01); H01L 29/66757 (2013.01); H01L 29/78621 (2013.01); H01L 27/3262 (2013.01); H01L 2029/7863 (2013.01);
Abstract

A thin film transistor includes a semiconductor layer including a source region, a drain region, a channel region, first lightly doped drain regions adjacent to the channel region and second lightly doped drain regions adjacent to the first lightly doped drain regions; wherein the second lightly doped drain regions have a doping concentration lower than that of the first lightly doped drain regions. According to the present application, the leakage current in a switching transistor may be further reduced, thereby avoiding instability and even failure in the operation of the assembly caused by overlarge leakage current.


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