The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Nov. 04, 2013
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Toshikazu Tanioka, Tokyo, JP;

Yoichiro Tarui, Tokyo, JP;

Kazuo Kobayashi, Tokyo, JP;

Hideaki Yuki, Tokyo, JP;

Yosuke Setoguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/04 (2006.01); H01L 21/324 (2006.01); H01L 21/321 (2006.01); H01L 21/16 (2006.01); H01L 21/67 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
H01L 21/324 (2013.01); H01L 21/046 (2013.01); H01L 21/67276 (2013.01); H01L 29/1608 (2013.01); H01L 29/66068 (2013.01); H01L 29/7827 (2013.01);
Abstract

A method of manufacturing a semiconductor device according to the present invention includes the steps of (b) forming, on a back face of a dummy substrate and back faces of a plurality of semiconductor substrates, inorganic films having such thicknesses as to be resistant to a temperature of a thermal oxidizing treatment or a heat treatment and to sufficiently decrease an amount of oxidation or reducing gaseous species to reach the back faces of the dummy substrate and the plurality of semiconductor substrates, (c) disposing the dummy substrate and the plurality of semiconductor substrates in a lamination with surfaces turned in the same direction at an interval from each other, and (d) carrying out a thermal oxidizing treatment or post annealing over the surfaces of the semiconductor substrates in an oxidation gas atmosphere or a reducing gas atmosphere after the steps (b) and (c).


Find Patent Forward Citations

Loading…