The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Oct. 01, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Inventor:

Jung-Woo Seo, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/31 (2006.01); H01L 21/033 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0337 (2013.01); H01L 21/0332 (2013.01); H01L 21/0338 (2013.01); H01L 21/32139 (2013.01);
Abstract

A double patterning method of forming a plurality of hole patterns having a small pitch using etch selectivities includes forming a patterning mask pattern defining a preliminary hole exposing an upper surface of a buffer mask layer, an inner spacer exposing the upper surface of the buffer mask layer on an inner wall of the preliminary hole, a buffer mask pattern having a first hole, and a core insulating pattern filling the preliminary hole and the first hole, an outer spacer to expose a first portion of the patterning mask pattern on the exposed portion of the outer side of the inner spacer, and an empty space exposing a first portion of the buffer mask pattern. A second portion of the patterning mask pattern and a second portion of the buffer mask pattern are exposed. A second hole is formed by removing the second portion of the buffer mask pattern.


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