The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Oct. 22, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Tomer Ish-Shalom, Raanana, IL;

Ronen Dar, Tel Aviv, IL;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G11C 16/349 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01);
Abstract

A method includes storing data in a group of analog memory cells by writing respective analog values into the memory cells in the group. After storing the data, the analog values are read from the memory cells in the group one or more times using one or more respective read thresholds so as to produce readout results. Reliability measures are computed for the read analog values based on the readout results. An offset of the one or more read thresholds from an optimal read threshold position is estimated based on the reliability measures. The reliability measures are modified to compensate for the estimated offset, and the data stored in the analog memory cells in the group is decoded using the corrected reliability measures.


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