The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Aug. 05, 2013
Eagle View Technologies, Inc., Bothell, WA (US);
Christopher Albert Ciarcia, Monroe, WA (US);
Eagle View Technologies, Inc., Bothell, WA (US);
Abstract
A statistical point pattern matching technique is used to match corresponding points selected from two or more views of a roof of a building. The technique entails statistically selecting points from each of orthogonal and oblique aerial views of a roof, generating radial point patterns for each aerial view, calculating the origin of each point pattern, representing the shape of the point pattern as a radial function, and Fourier-transforming the radial function to produce a feature space plot. A feature profile correlation function can then be computed to relate the point match sets. From the correlation results, a vote occupancy table can be generated to help evaluate the variance of the point match sets, indicating, with high probability, which sets of points are most likely to match one another.