The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Oct. 22, 2012
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sang Oak Woo, Anyang-si, KR;

Seok Yoon Jung, Seoul, KR;

Shi Hwa Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/40 (2011.01); G06T 17/00 (2006.01); G06T 15/30 (2011.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06T 15/005 (2013.01);
Abstract

An apparatus and method for tile binning are provided. The tile binning apparatus may include a determination unit to determine whether a triangle obtained as a result of geometric processing includes an abnormal edge, an overlap test unit to perform an overlap test with respect to each edge of the triangle when the abnormal edge is absent from the triangle, and to sort three vertices of the triangle according to Y-axis values and perform the overlap test with respect to each edge of the triangle based on a sorting result when the triangle includes the abnormal edge, and a bin array update unit to update a bin array based on an overlap test result.


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