The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Feb. 28, 2014
Thales, Neuilly-sur-Seine, FR;
Jean-Michel Gaucel, Mandelieu, FR;
Denis Simeoni, Cannes-la-Bocca, FR;
Sandrine Mathieu, Cannes-la-Bocca, FR;
THALES, Courbevoie, FR;
Abstract
A device and method for dynamically adapting spatial resolution for imager Fourier transform spectrometers makes it possible to acquire data in interferogram mode and image mode on survey points for an observed scene, each survey point being associated a matrix of macro-pixels and defined by a plurality of zones. For each survey point, analysis of the content of each zone is carried out on the basis of data of the image mode. Classification into clear zone or non-clear zone is carried out as a function of proportion of cloud, and clear-pixel data are generated on the basis of the sum of the data of the macro-pixels of the clear zone class. Survey point data are generated on the basis of the sum of the data of all the macro-pixels of the matrix associated with the survey point. The survey point and clear pixel data streams are transmitted to the ground.