The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
May. 07, 2014
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Oliver Schreer, Berlin, DE;
Frederik Zilly, Berlin, DE;
Peter Kauff, Berlin, DE;
Christian Riechert, Berlin, DE;
Marcus Mueller, Berlin, DE;
Abstract
An apparatus for estimating a disparity map based on at least two images is provided. The apparatus includes at least two processing units, which include a pixel recursion unit configured to determine a disparity value as a pixel recursion disparity candidate based on a plurality of pixel values of the at least two images and a selector configured to select a selected disparity candidate to determine at least one of the disparity map values of the disparity map. The selector is adapted to select the selected disparity candidate from a candidate group assigned to the selector. The candidate group assigned to the selector includes the pixel recursion disparity candidate, a second disparity candidate and a third disparity candidate. Moreover, the selector is adapted to select the selected disparity candidate independently from a different selector of a different processing unit of the at least two processing units.