The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jun. 12, 2013
Applicant:

Symbol Technologies, Inc., Lincolnshire, IL (US);

Inventors:

Ankur R Patel, Palatine, IL (US);

Boaz J Super, Oak Park, IL (US);

Assignee:

Symbol Technclogies, LLC, Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01); G06K 9/46 (2006.01); G06F 17/30 (2006.01); G06K 9/32 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); G06F 17/30247 (2013.01); G06F 17/30256 (2013.01); G06K 9/3241 (2013.01); G06K 9/4671 (2013.01); G06K 9/6202 (2013.01); G06K 9/6218 (2013.01); G06K 9/6226 (2013.01);
Abstract

An improved object recognition method is provided that enables the recognition of many objects in a single image. Multiple instances of an object in an image can now be detected with high accuracy. The method receives a plurality of matches of feature points between a database image and a query image and determines a kernel bandwidth based on statistics of the database image. The kernel bandwidth is used in clustering the matches. The clustered matches are then analyzed to determine the number of instances of the object within each cluster. A recursive geometric fitting can be applied to each cluster to further improve accuracy.


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