The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Nov. 11, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Liyan Zhang, Irvine, CA (US);

Juwei Lu, Oakville, CA;

Bradley Scott Denney, Irvine, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00677 (2013.01); G06K 9/00288 (2013.01);
Abstract

Systems, devices, and methods for generating attribute scores obtain a plurality of object images; generate a respective first attribute score of a first attribute for each object image in the plurality of object images based on the object images; calculate a respective pairwise object-similarity measure for pairs of object images in the plurality of object images; and refine the first attribute score of an object image in the plurality of object images based at least in part on the attribute scores of other object images in the plurality of object images and on the object-similarity measures of the pairs of object images in the plurality of object images.


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