The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Nov. 15, 2012
Applicant:

Marvell Israel (M.i.s.l.) Ltd., Yokneam, IL;

Inventors:

Eldad Bar-Lev, Kiryat Tivon, IL;

Aaron Landau, Zichron-Yakov, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G06F 1/24 (2006.01); G06F 11/00 (2006.01); G06F 1/10 (2006.01); G06F 1/12 (2006.01); G06F 1/08 (2006.01);
U.S. Cl.
CPC ...
G06F 1/105 (2013.01); G06F 1/10 (2013.01); G06F 1/12 (2013.01); G06F 1/08 (2013.01);
Abstract

Methods and apparatuses for processing systems capable of compensating for data skew are disclosed. An example apparatus can include delay circuitry that includes a plurality of delay devices each being individually adjustable to produce an individual delay for each data line with each data line including branches of different lengths leading to different memory devices, and memory control circuitry coupled to the delay circuitry and configured to determine, for each data line, an individual delay based on an optimized critical window, the optimized critical window being based on multiple chip select signals.


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