The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jul. 19, 2012
Applicants:

Chih-kuang Chang, New Taipei, TW;

Xin-yuan Wu, Shenzhen, CN;

Jin-gang Rao, Shenzhen, CN;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Xin-Yuan Wu, Shenzhen, CN;

Jin-Gang Rao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G06F 15/00 (2006.01); G05B 19/401 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); G06T 17/00 (2013.01); G06T 2210/32 (2013.01);
Abstract

In a method for generating a measurement program of a product, a CAD file of the product is read and attribute data of the product is obtained from the CAD file. By creating a mesh over the attribute data of the product using a plurality of triangles, the method obtains coordinate information of measuring points of the product from the CAD file, arranges the measuring points of the product into one or more geometrical elements using a curve fitting method, and obtains measuring information of each geometrical element. By integrating the measuring information of each of the one or more geometrical elements into a predefined program model, a measurement program can be generated and displayed on a display device.


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