The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Aug. 01, 2012
Applicants:

Stephen Kamling Chiu, Katy, TX (US);

Phil Dean Anno, Houston, TX (US);

Inventors:

Stephen KamLing Chiu, Katy, TX (US);

Phil Dean Anno, Houston, TX (US);

Assignee:

ConocoPhillips Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G01V 1/28 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/28 (2013.01); G01V 1/36 (2013.01); G01V 2210/57 (2013.01);
Abstract

A process for overcoming aliasing using a minimum weighted norm interpolation (MWNI) technique may include computing an initial, regularly interpolated model with no data gaps and computing a plurality of initial spectral weights using the initial, regularly interpolated model. The initial, regularly interpolated model is used to compute the spectral weights as initial constraints in a least-squares solution methodology. The initial spectral weights are used as initial constraints in a constrained minimum weighted norm interpolation data reconstruction. The process may further include converting the initial, regularly interpolated model into a frequency domain and computing unknown spectral weights from frequency data at each frequency slice of the initial, regularly interpolated model using Fourier transform. The process results in reducing aliasing artifacts and improving data regularization.


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