The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Apr. 09, 2012
Applicants:

Jacob J. Mertz, Glen Mills, PA (US);

Robert E. Bridges, Kennett Square, PA (US);

Inventors:

Jacob J. Mertz, Glen Mills, PA (US);

Robert E. Bridges, Kennett Square, PA (US);

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/481 (2006.01); G01C 15/00 (2006.01); G01S 7/48 (2006.01); G01S 7/491 (2006.01); G01S 17/42 (2006.01); G01S 17/66 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4818 (2013.01); G01C 3/08 (2013.01); G01C 15/002 (2013.01); G01S 7/4808 (2013.01); G01S 7/4813 (2013.01); G01S 7/491 (2013.01); G01S 17/42 (2013.01); G01S 17/66 (2013.01); G01S 17/89 (2013.01);
Abstract

A measurement system includes a signal generator producing an RF modulation frequency and sampling frequency and sending the sampling frequency to an ADC, and sending the RF frequency to modulate a first light source to produce a first light; an optical system sending a portion of the first light to a reference optical detector a portion of the first light out a measurement device to a target that returns a second light to the optical system which sends the second light to a measure optical detector, the reference and measure optical detectors converting the optical signals into corresponding electrical signals; a first ADC channel receiving the electrical measure signal and producing digital measure values; a second ADC channel receiving the electrical reference signal and producing digital reference values; and a processor receiving the digital measure and reference values and calculating the device to target distance.


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