The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
May. 20, 2015
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Gary L. Swoboda, Sugar Land, TX (US);
Robert A. McGowan, Cedar Park, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31705 (2013.01); G01R 31/318533 (2013.01); G01R 31/318536 (2013.01); G01R 31/318544 (2013.01); G01R 31/318555 (2013.01); G01R 31/318572 (2013.01); G01R 31/318597 (2013.01); G06F 11/2236 (2013.01);
Abstract
A system comprises a plurality of components, scan chain selection logic coupled to the components, and override selection logic coupled to the scan chain selection logic. The scan chain selection logic selects various of the components to be members of a scan chain under the direction of a host computer. The override selection logic detects a change in the scan chain and, as a result, blocks the entire scan chain from progressing.