The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
May. 09, 2011
Joshua G. Nickel, San Jose, CA (US);
Fernando Urioste, Pleasanton, CA (US);
Justin Gregg, San Francisco, CA (US);
Adil Syed, Santa Clara, CA (US);
Jason Sloey, San Jose, CA (US);
Jonathan Haylock, Los Angeles, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Fernando Urioste, Pleasanton, CA (US);
Justin Gregg, San Francisco, CA (US);
Adil Syed, Santa Clara, CA (US);
Jason Sloey, San Jose, CA (US);
Jonathan Haylock, Los Angeles, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.