The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Aug. 27, 2010
Applicants:

Takashi Yamato, Kakogawa, JP;

Hiroshi Kurono, Kobe, JP;

Inventors:

Takashi Yamato, Kakogawa, JP;

Hiroshi Kurono, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1004 (2013.01); G01N 35/1002 (2013.01); G01N 2035/00673 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/0443 (2013.01); Y10T 436/11 (2015.01); Y10T 436/111666 (2015.01);
Abstract

A specimen analyzing apparatus for measuring a specimen by using a reagent which has a dispensing mechanism which includes a dispensing tube for suctioning and discharging liquid; a reagent container holder from which a reagent container is removable when the reagent container is in a container removal area; a receiving section for receiving a replacement command for a replacement of the reagent; and a controller for controlling the dispensing mechanism so as to retreat the dispensing tube from the container removal area when the replacement command has been received by the receiving section. Also, a control method for a specimen analyzing apparatus.


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