The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jun. 08, 2010
Applicants:

Christian Armand Marceau, Lieusaint, FR;

Andre Rouff, Elancourt, FR;

Inventors:

Christian Armand Marceau, Lieusaint, FR;

Andre Rouff, Elancourt, FR;

Assignee:

SNECMA, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/12 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/902 (2013.01);
Abstract

A device for testing to detect defects at a surface or at shallow depth in a part, for example a blade root for an airplane engine fan. The device includes a probe including a sensor, the probe being hinge-mounted to the end of a handle, a guide presenting a reference surface, and a mechanism adjusting the position of the guide parallel to an axis of the handle.


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