The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Feb. 27, 2012
Applicants:
Joseph D. Drescher, Middletown, CT (US);
Erik M. Pedersen, Cheshire, CT (US);
Inventors:
Joseph D. Drescher, Middletown, CT (US);
Erik M. Pedersen, Cheshire, CT (US);
Assignee:
United Technologies Corporation, Hartford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G01B 5/00 (2006.01); G01B 5/004 (2006.01); G01B 5/20 (2006.01); B23Q 16/00 (2006.01); G01B 1/00 (2006.01); G01B 3/14 (2006.01); B23Q 3/00 (2006.01); B25B 1/00 (2006.01); B25B 1/20 (2006.01); G01C 17/38 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2006.01); G01B 11/00 (2006.01); G01B 11/30 (2006.01); G01B 11/02 (2006.01); G01B 11/24 (2006.01); G01B 11/03 (2006.01); G01B 11/25 (2006.01); G01N 21/93 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01B 11/00 (2013.01); G01B 11/022 (2013.01); G01B 11/026 (2013.01); G01B 11/03 (2013.01); G01B 11/24 (2013.01); G01B 11/2408 (2013.01); G01B 11/25 (2013.01); G01B 11/303 (2013.01); G01N 21/93 (2013.01); G01N 21/95692 (2013.01); G06T 7/001 (2013.01); G06T 7/0002 (2013.01); G06T 7/0004 (2013.01); G06T 7/0008 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.