The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Nov. 18, 2014
National Central University, Taoyuan, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Shu-Liang Liaw, Taipei, TW;
Chien-Ku Chen, Taichung, TW;
Hsin-Yi Wang, New Taipei, TW;
Yang-Yu Lin, Tainan, TW;
Chen-Hua Chu, Hsinchu County, TW;
Chih-Chung Chan, Tainan, TW;
National Central University, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
Measuring device of the present invention includes a plurality of measuring sites for generating a plurality of optical paths and various dilutions. The range for concentration measurement and the measurement accuracy are enhanced due to the plurality of optical path length, and the interference on the measurement ranges and results caused by the concentration or the turbidity of suspended solid is reduced and removed by water sample dilution, and thus the characteristic wavelengths of the components in the water are measured. Next, the information of spectrum database is used to determine the ingredients which may exist in the water (qualitative analysis), and UV-VIS-NIR absorbance spectrum analysis is used to obtain the concentration of the respective ingredients in the water at the same time (quantitative analysis).