The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Jan. 21, 2010
Applicant:

Robert G. Messerschmidt, Los Altos, CA (US);

Inventor:

Robert G. Messerschmidt, Los Altos, CA (US);

Assignee:

Rare Light, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/453 (2006.01); G01J 3/457 (2006.01); G01N 21/45 (2006.01); G01N 21/552 (2014.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4531 (2013.01); G01J 3/457 (2013.01); G01N 21/45 (2013.01); G01N 21/552 (2013.01); G01N 21/65 (2013.01);
Abstract

A correlation interferometric spectroscopy devices are described that detect the spectral characteristics of a sample wherein device consists of an electromagnetic radiation source for exciting a sample with photons; and a detector adapted to detect an arrival time of a photon at the detector and further adapted to detect a delay between the arrival time of different photons. The device may further consist of an autocorrelator adapted to analyze the between the arrival of photons at the detector. The device may also be used together with other spectral detection and characterizing systems, such as Raman spectroscopy and attenuated total reflectance spectroscopy. Also provided herein are methods, systems, and kits incorporating the correlation interferometric spectroscopy device.


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