The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Mar. 15, 2013
Applicants:
Hubert Labelle, Laval, CA;
Jean-marc Mac-thiong, Montreal, CA;
Stefan Parent, Saint-Lambert, CA;
Mark Driscoll, Notre-Dame-de-I'lle-Perrot, CA;
Inventors:
Hubert Labelle, Laval, CA;
Jean-Marc Mac-Thiong, Montreal, CA;
Stefan Parent, Saint-Lambert, CA;
Mark Driscoll, Notre-Dame-de-I'lle-Perrot, CA;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/02 (2006.01); G01C 9/10 (2006.01); G01C 9/28 (2006.01);
U.S. Cl.
CPC ...
G01C 9/02 (2013.01); G01C 9/10 (2013.01); G01C 9/28 (2013.01);
Abstract
An apparatus enabling inclination measurements or irregular surfaces comprising a retaining end adapted to temporarily hold a device equipped with an inclinometer and a supporting end, fixed to the retaining end, conformed to abut an irregular surface whereby the apparatus enables the device equipped with an inclinometer to measure inclination of an irregular surface.