The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Sep. 19, 2013
Kabushiki Kaisha Topcon, Toyko, JP;
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Abstract
An image measuring method according to an embodiment comprises a clock generating step, a noise reducing step, a data acquisition step, a digital data generating step and an image data generating step. In the clock generating step, clock signals are generated. In the noise reducing step, the noise of the generated clock signals is reduced to a predetermined threshold or lower. In the data acquisition step, analog data indicating the inner morphology of an object is acquired. In the digital data generating step, digital data is generated by sampling the analog data based on the clock signals with reduced noise. In the image data generating step, image data of the object is generated by performing data processing including Fourier transform on the generated digital data.