The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Jun. 03, 2011
Andrew Ezekiel Wessman, Walton, KY (US);
David Paul Mourer, Beverly, MA (US);
Daniel Yeuching Wei, Reading, MA (US);
Andrew Ezekiel Wessman, Walton, KY (US);
David Paul Mourer, Beverly, MA (US);
Daniel Yeuching Wei, Reading, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
Processes for fabricating components to have two or more regions with different grain structures, and components produced by such processes. The processes entail performing at least one forging step on a preform to produce a profile having at least a first portion corresponding to the first region of the component. The preform is formed of a precipitation-strengthened alloy having a solvus temperature, and the at least one forging step comprises a nonfinal forging step performed at a first strain rate and at a first subsolvus temperature that is below the solvus temperature of the alloy. A subsequent forging step is performed on the profile to produce a final profile comprising the first portion and a second portion corresponding to the second region of the component. The subsequent forging step is performed at a strain rate and at a subsequent subsolvus temperature, wherein at least one of the subsequent strain rate and subsequent subsolvus temperature is either higher or lower than the first strain rate or first subsolvus temperature. A heat treatment is then performed on the final profile to cause grain growth, wherein the first portion of the final profile has a different grain size than the second portion.