The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Aug. 24, 2010
Shin Tanaka, Hamamatsu, JP;
Satoshi Shimada, Hamamatsu, JP;
Shin Tanaka, Hamamatsu, JP;
Satoshi Shimada, Hamamatsu, JP;
KOWA COMPANY LTD., , JP;
Abstract
A visual field examination system measures the visual field of an eye. Quantitative information of a 3D retinal layer structure is acquired by detecting a range in which a peak of a retinal reflectance distribution obtained by OCT scanning is lost. A position of the fovea of the eye fundus is identified based on the acquired information. A location of a range in which the peak of the retinal reflectance distribution is lost is specified in a 2D fundus image based on the position of the fovea, and the specified location is marked on a region of the 2D fundus image. A position of the marked region is detected, and a visual inspection field region is generated based on the detection. Visual field examination points of the visual inspection field region are presented to the eye through a visual field dome for carrying out visual field examination of the eye.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile