The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Mar. 01, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Boris Shpilyuck, Dublin, CA (US);

Dmitry Limonov, Dublin, CA (US);

Alex Rankov, Danville, CA (US);

Dmitry Volchegursky, Pleasanton, CA (US);

Assignee:

EMC CORPORATION, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/16 (2013.01);
Abstract

Identifying root causes of application underachievement in a virtually provisioned environment is described. A utilization measurement is recorded for each resource for each server in a virtually provisioned environment associated with an application operation if an application operation time exceeds a time constraint. The resources include a central processing unit resource, a memory resource, a network resource, and/or an input-output resource. Each utilization measurement is converted to a corresponding utilization range of multiple utilization ranges. After the application operation time exceeds the time constraint on a specified number of occasions, an identification of a specific resource for a specific server as a root cause of the application operation time exceeding the time constraint is output if the utilization record includes a specific range for the specific resource for the specific server more than a specified frequency.


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