The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Nov. 13, 2012
Apple Inc., Cupertino, CA (US);
Anh Luong, Santa Clara, CA (US);
Aristoteles D. Pritsopoulos, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A test system for testing a wireless electronic device is provided. The test system may include a test host and a tester. The test host may instruct the electronic device under test (DUT) to transmit radio-frequency test signals in a selected resource block of a desired channel identified by a channel number in the Long Term Evolution frequency band. The tester may measure harmonic output power levels of the radio-frequency test signals transmitted by the DUT at harmonic frequencies of the selected resource block. The test host may compare the measured harmonic output power levels to threshold power levels to characterize the radio-frequency performance of wireless circuitry in the DUT. The test system may test the radio-frequency performance of the DUT for radio-frequency test signals transmitted by the DUT in some or all resource blocks in the desired Long Term Evolution band.