The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jun. 01, 2012
Jinrong Yin, Shenzhen, CN;
Sulin Yang, Shenzhen, CN;
Jinrong Yin, Shenzhen, CN;
Sulin Yang, Shenzhen, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
Embodiments of the present disclosure describe a method and an apparatus for testing an optical network, which may be applicable to an integrated OTDR and the field of optical network technologies. The method includes obtaining a maximum test time of a single group test; dividing a total test time into at least two groups of single group test time that is not greater than the maximum test time when the total test time is greater than the maximum test time of the single group test; performing the single group tests in sequence according to each single group test time; and instructing optical network equipment to restore to a normal working state when the single group test time corresponding to each single group test ends.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile