The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jun. 03, 2014
Yun Chiu, Allen, TX (US);
Yuan Zhou, Dallas, TX (US);
Yanqing LI, Plano, TX (US);
The Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
Disclosed are systems employing a digital background calibration technique for linearizing the front-end circuits of IF-sampling ADCs. The disclosed systems and methods employ a power series model to eliminate the static non-linearity with split-ADC architecture and LMS algorithm for background learning. The present disclosure utilizes a technique for applying two different offset signals to the input of two conversion paths in the split-ADC architecture. When the system nonlinearity is successfully calibrated, the output difference between the two conversion paths results in a fixed offset that is identical to the offset injected at the input. The disclosed digital background calibration technique can linearize the front-end circuits of high-speed ADCs and significantly reduce power consumption.