The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jun. 12, 2012
Yuri Lopez DE Meneses, Valangin, CH;
Damien Coste, Le Locle, CH;
Massimo Fauro, Le Landeron, CH;
Serge Kunzli, La Chaux-de-Fonds, CH;
Yuri Lopez De Meneses, Valangin, CH;
Damien Coste, Le Locle, CH;
Massimo Fauro, Le Landeron, CH;
Serge Kunzli, La Chaux-de-Fonds, CH;
ISMECA SEMICONDUCTOR HOLDING SA, La-Chaux-de-Fonds, CH;
Abstract
A wafer handler including, a wafer loading station () for loading a wafer () mounted on a tack film (); a tensioner () for tensioning the tacky film; a picking module () for successively picking a plurality of devices from the wafer; a vision system () with one or several cameras () for capturing a first image of the wafer or of portions of the wafer, the first image showing a plurality of devices, wherein the vision system is arranged for determining from the first image the individual position of a plurality of devices. The wafer handler further includes an additional camera () positioned proximate to the picking module () and arranged for capturing an second image of a device to be picked, wherein the second image is used for fine adjustment of the wafer so that the device to be picked is centered under the picking module.