The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Jun. 21, 2013
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Junji Tominaga, Tsukuba, JP;

James Paul Fons, Tsukuba, JP;

Alexander Kolobov, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01); G11C 13/00 (2006.01); B82Y 10/00 (2011.01); G11B 7/2433 (2013.01); G11B 7/243 (2013.01); H01L 29/15 (2006.01); H01L 29/18 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0009 (2013.01); B82Y 10/00 (2013.01); G11B 7/2433 (2013.01); H01L 45/06 (2013.01); H01L 45/144 (2013.01); H01L 45/1625 (2013.01); G11B 2007/24312 (2013.01); G11B 2007/24314 (2013.01); G11B 2007/24316 (2013.01); H01L 29/15 (2013.01); H01L 29/18 (2013.01);
Abstract

Recording and erasing of data in PRAM have hitherto been performed based on a change in physical characteristics caused by primary phase-transformation of a crystalline state and an amorphous state of a chalcogen compound including Te which serves as a recording material. Since, however, a recording thin film is formed of a polycrystal but not a single crystal, a variation in resistance values occurs and a change in volume caused upon phase-transition has placed a limit on the number of times of readout of record. In one embodiment, the above problem is solved by preparing a solid memory having a superlattice structure of thin films including Ge and thin films including Sb. The solid memory can realize the number of times of repeated recording and erasing of 10.


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