The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Jan. 12, 2011
Applicant:

Sonoko Miyatani, Tokyo, JP;

Inventor:

Sonoko Miyatani, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0046 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30164 (2013.01);
Abstract

There is provided a method for accurately estimating a position and orientation of an object even if the object is more dispersive in shape than a three-dimensional geometric model with a standard shape. The statistic of deviation of a feature constituting a three-dimensional model representing a three-dimensional standard shape of an object is estimated to determine a reliability for each feature. The amount of deviation is calculated between the feature extracted from observation data obtained by an imaging apparatus and the feature in the three-dimensional model. The three-dimensional position and orientation of the object is estimated based on the amount of deviation and the reliability related to each feature extracted from the three-dimensional model.


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